Class B MIL-PRF-28861 Test Sequence SummaryClass B Reliability Levels are outlined in MIL-PRF-28861 and is prescribed for most military/aerospace requirements. It is more stringent than MIL-PRF-15733, requiring 100% screening that includes thermal shock, voltage conditioning, and x-ray. Periodic Group B testing is performed on units selected at random from production lots. |
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Inspection |
Class B |
“R” level testing |
Group I |
“R” level screening is performed by Spectrum Control's Hi-Rel Laboratory as detailed below. Customers requiring special tests may order to their own specifications or simply order to level R and then note additions or deviations.
“R” level test sequence
(100% testing unless otherwise specified)
Thermal Shock: 5 cycles from -55°C to +125°C in accordance with MIL-STD-202, Method 107D, Condition A.
Burn-in: 100 hours at 1.4x rated DC voltage, 125°C.
Seal Test: MIL-STD-202, Method 112, Test Condition A. Hermetic sealed parts only.
Capacitance and Dissipation Factor: MIL-STD-202, Method 305, frequency 1kHz.
Dielectric Withstanding Voltage: 2.5 times the rated DC voltage for 5 ±1 second at 25°C, with 50 mA maximum charging current.
Insulation Resistance: MIL-STD-202, Method 302, 125°C at rated DC voltage and room temperature (25°C). The 125°C requirement shall be 10% of the specified catalog IR at 25°C.
DC Resistance: MIL-STD-202, Method 303.
Insertion Loss Test: Sample per MIL-PRF-15733. At full rated load in accordance with MIL-STD-220. The minimum insertion loss shall be defined in the filter catalog.
Visual and Mechanical: In accordance with MIL-PRF-15733.
Marking: All filters which have successfully completed the test sequence shall be marked with an “R” in the second part of the number. For example, a standard SCI-2130-004 becomes SCI-R2130-004 and 9051-100-0000 becomes 9051-R100-0000, and 51-719-011 becomes 51-R719-011 after completion of the Hi-Rel Level “R” Test Sequence.
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AC voltage drop (when applicable) | X | |
Voltage and temperature limits of capacitance | X | |
Insertion loss (at temperature) | X | |
Barometric pressure (reduced) | X | |
Temperature rise | X | |
Current overload | X | |
Terminal strength | X | |
Thermal shock and immersion | X | |
Group II |
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Subgroup 1 |
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Life | X | |
Subgroup 2 |
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Resistance to soldering heat | X | |
Salt spray (corrosion) | X | |
Radiographic inspection | X | |
Subgroup 3 |
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Resistance to solvents | X | |
Shock (specified pulse) | X | |
Vibration (high frequency) | X | |
Moisture resistance | X | |
Seal (when applicable) | X | |
Radiographic inspection | X |